Wafer μBumps 3D Scan


江西快三彩票app下载High performance 2D and 3D metrology and inspection for semiconductor industry: Wafer, CSP strips, MEMS, etc.


  • System design: wafer, CSP substrates, MEMS etc,
  • Laser and camera optics,
  • Mechanical: sensors and electro-optics, motion system
  • Electrical / electronics: camera, laser, automation, vision processing, etc
  • Software: vision algorithms and inspection systems. 


  • Part procurement
  • Assembly
  • Testing
  • Quality control
  • Packing & Shipping


  • Installation support at OEM and end user
  • Commissioning support


  • Spare parts
  • Warranty

Recent Examples

3D-2D Wafer scanner performing
simultaneous both 2D and 3D scans

2D-3D Wafer scanner 


江西快三彩票app下载Fiber optics coupled LED lamp

Fiber optics coupled LED strobe light
LED strobe light